smartctl 6.5 2016-01-24 r4214 [i686-linux-4.10.0-28-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke,
www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 2.5" HDD MK..52GSX
Device Model: TOSHIBA MK3252GSX
Serial Number: 58Q1P2AHT
LU WWN Device Id: 5 000039 10218878d
Firmware Version: LV010M
User Capacity: 320,072,933,376 bytes [320 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 1.5 Gb/s
Local Time is: Sat Oct 7 15:12:39 2017 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 134) minutes.
SCT capabilities: (0x0039) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1697
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 4398
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 082 082 000 Old_age Always - 7346
10 Spin_Retry_Count 0x0033 187 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 3197
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 210
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 83
193 Load_Cycle_Count 0x0032 086 086 000 Old_age Always - 143589
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 30 (Min/Max 11/54)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 3
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 104
222 Loaded_Hours 0x0032 087 087 000 Old_age Always - 5496
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 341
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 3
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3 occurred at disk power-on lifetime: 7322 hours (305 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 1f 4d c9 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00c94d1f = 13192479
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 20 00 4d c9 e0 00 00:26:12.149 WRITE DMA EXT
35 00 a0 80 4e cd e0 00 00:26:12.148 WRITE DMA EXT
25 00 a0 e0 10 24 e0 00 00:26:12.137 READ DMA EXT
35 00 08 70 eb 23 e0 00 00:26:12.135 WRITE DMA EXT
25 00 08 48 75 3b e0 00 00:26:12.134 READ DMA EXT
Error 2 occurred at disk power-on lifetime: 7296 hours (304 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 0f 4a 59 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00594a0f = 5851663
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 10 49 59 e0 00 02:44:09.602 READ DMA EXT
25 00 00 10 48 59 e0 00 02:44:09.599 READ DMA EXT
25 00 00 10 47 59 e0 00 02:44:09.588 READ DMA EXT
25 00 08 a0 4b 59 e0 00 02:44:09.581 READ DMA EXT
25 00 08 a8 63 59 e0 00 02:44:09.578 READ DMA EXT
Error 1 occurred at disk power-on lifetime: 7225 hours (301 days + 1 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 2f 17 04 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x0004172f = 268079
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 00 30 16 04 e0 00 00:01:56.390 WRITE DMA EXT
35 00 00 30 15 04 e0 00 00:01:56.388 WRITE DMA EXT
35 00 00 30 14 04 e0 00 00:01:56.387 WRITE DMA EXT
35 00 00 30 13 04 e0 00 00:01:56.386 WRITE DMA EXT
35 00 00 30 12 04 e0 00 00:01:56.266 WRITE DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.